Invited speakers

• Assoc. Prof. Loredana Parlato, Universita di Napoli „Federico II“, Napoli, Italy
„ The effect of the properties of thin films on superconducting nano/microstrip detectors.“

• Dr. Aarne Kasikov, Institute of Physics, University of Tartu, Tartu, Estonia

• Prof. Harri Lipsanen, Department of Electronics and Nanoengineering, Micronova Research Centre, Aalto University, Aalto, Finland

• Assoc. Prof. Miroslav Mikolasek, Institute of Electronics and Photonics, Slovak University of Technology, Bratislava, Slovakia

• Prof. Ivan Ohlídal, Masaryk University, Faculty of Science, Brno
Czech Republic
„ Optical characterization of non-uniform thin films.“

• Prof. Grzegorz Jung, Ben Gurion University, Israel

• Dr. Matej Jergel, Institute of Physics SAS, Bratislava, Slovakia

• Dr. Jiří Vohánka, Masaryk University, Faculty of Science, Brno
Czech Republic

• Prof. Kazumasa IIDA, College of Industrial Technology, Nihon University, Japan

• Dr. Joanna Bauer, Wroclaw University of Technology, Poland

• Dr. Stefan Chromik, Institute of Electrical Engineering SAS, Bratislava, Slovakia
„ Influence of the Preparation and Structure of the AlN Layer on the Electrical Properties of the MoS₂/AlN/Si Thin-Film Structure “

• Assoc. Prof. Tomas Plecenik, Centre for Nanotechnology and Advanced Materials, FMPI Comenius University Bratislava, Bratislava, Slovakia